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Posts Tagged ‘SIFT-MS’

The Evolution from SIFT-MS to PTR-MS

From SIFT to ultimate performance PTR-TOF trace gas analyzers

The success story of PTR-TOFMS has its roots in the so-called “Flowing Afterglow Technique”, introduced in the 1960s. From this starting point continuous research and innovations by various experts, who wanted to eliminate instrumental drawbacks and shortcomings, have led to different technological milestones, among them SIFT-MS.

But innovation didn’t stop there and technological breakthroughs resulted in the development of PTR-MS, ultimately PTR-TOFMS as the current established “gold standard” for direct and extremely sensitive trace gas analysis.

Read our new whitepaper on the evolution from SIFT to PTR-TOF and all the benefits that are now available to you, beyond SIFT-MS.

PTR-MS compared to SIFT-MS, APCI and MS-e-noses

A new review article in Trends in Analytical Chemistry discusses direct-injection mass spectrometry for VOC analysis.

F. Biasioli, C. Yeretzian, T. D. Märk, J. Dewulf and H. Van Langenhove wrote an interesting review with the title “Direct-injection mass spectrometry adds the time dimension to (B)VOC analysis” that was recently published in Trends in Analytical Chemistry 30 (7) (2011).

We at IONICON are often asked what actually the differences and in our case, the benefits of the PTR-MS technology compared to other, similar methods are. Not only a technical comparison is of interest but also feedback from studies in the field covering various applications is in high demand by people contacting us.

For me the advantages of PTR-MS are obvious and I also know which position our technology and products have in the market, but of course it is more credible if an article in a peer-reviewed journal has such a comparison as topic and gives the reader a chance to follow a well grounded debate.
The synopsis of this article with regards to PTR-MS and my conclusion, I would summarize as follows only mentioning the most intriguing arguments:

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